Title :
Miniaturization and Optimization of RF SAW Filter Using Wafer Level Packaging Technology
Author :
Kim, Tae Hoon ; Jeung, Won Kyu ; Yang, Si Joong ; Choi, Seog Moon ; Park, Seung Wook ; Kim, Hyun Ho ; Ha, Job ; Park, Mi Jin ; Kao, S. ; Hong, J.P. ; Yi, Sung ; Hwang, Jun Sik ; Lim, Ji Hyuk ; Kim, Woon Bae
Author_Institution :
Samsung Electro-Mech. Co., LTD, Suwon
fDate :
May 29 2007-June 1 2007
Abstract :
In this paper, we describes the wafer level surface acoustic wave (SAW) filter package, 1.0times0.8 mm2, which is applicable for radio frequency (RF) stage in mobile phones. The SAW filter is reduced in size and thickness by using a 4" wafer level package process technique. The technique uses interconnection via and LiTaO3 (LT)-LiTaO3 (LT) wafer bonding structure. The interconnection via is formed through LT wafer by using sand blasting or laser drilling method. The AuSn eutectic bonding enables the connection of the signal pad on the SAW chip, with gold metallized LT wafer package. This eutectic bonding ensures that the SAW chip is protected mechanically and connected electrically, with the package. In order to simulate and optimize the structure and characteristics of wafer level SAW filter package, we used HFSS and ADS software. Frequency responses of measurement and simulation are compared with wafer level SAW filter package. The results of reliability tests for wafer level SAW filter package will be discussed.
Keywords :
frequency response; laser beam machining; reliability; surface acoustic wave filters; wafer bonding; wafer level packaging; RF SAW filter; eutectic bonding; frequency responses; laser drilling method; mobile phones; reliability tests; sand blasting; surface acoustic wave; wafer bonding structure; wafer level packaging technology; Acoustic waves; Drilling; Gold; Mobile handsets; Packaging; Radio frequency; SAW filters; Surface acoustic waves; Wafer bonding; Wafer scale integration;
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2007.373853