مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2877945

Title :

For Test Automation, Silicon is Free

Author :

Gheewala, Tushar

fYear :

1991

fDate :

26-30 Oct 1991

Firstpage :

1111

Keywords :

Application specific integrated circuits; Automatic testing; Circuit testing; Costs; Integrated circuit testing; Manufacturing automation; Signal design; Silicon; System testing; Time to market;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 1991, Proceedings., International

ISSN :

1089-3539

Print_ISBN :

0-8186-9156-5

Type :

conf

DOI :

10.1109/TEST.1991.519786

Filename :

519786

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2877945