DocumentCode
2877945
Title
For Test Automation, Silicon is Free
Author
Gheewala, Tushar
fYear
1991
fDate
26-30 Oct 1991
Firstpage
1111
Keywords
Application specific integrated circuits; Automatic testing; Circuit testing; Costs; Integrated circuit testing; Manufacturing automation; Signal design; Silicon; System testing; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519786
Filename
519786
Link To Document