• DocumentCode
    2877960
  • Title

    DISTRACTIONS IN DESIGN FOR TESTABILITY AND BUILT-IN SELF-TEST

  • Author

    Stroud, Charles E.

  • fYear
    1991
  • fDate
    26-30 Oct 1991
  • Firstpage
    1112
  • Keywords
    Built-in self-test; Circuit faults; Circuit testing; Design automation; Design for testability; High level synthesis; Large scale integration; Logic testing; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1991, Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-9156-5
  • Type

    conf

  • DOI
    10.1109/TEST.1991.519787
  • Filename
    519787