DISTRACTIONS IN DESIGN FOR TESTABILITY AND BUILT-IN SELF-TEST
Author :
Stroud, Charles E.
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
1112
Keywords :
Built-in self-test; Circuit faults; Circuit testing; Design automation; Design for testability; High level synthesis; Large scale integration; Logic testing; Test pattern generators; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
