• DocumentCode
    2877972
  • Title

    Wafer-Level Glass Capping as Drop-in for Miniaturized, Advanced Optical COB Packaging

  • Author

    Seidemann, Volker ; Gyenge, Oliver ; Hansen, Ulli ; Heuser, Thorsten ; Maus, Simon ; Mund, Dietrich ; Espertshuber, Klaus ; Wilke, Ralph ; Leib, Jürgen

  • Author_Institution
    SCHOTT Electron. GmbH, Berlin
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    600
  • Lastpage
    604
  • Abstract
    The novel wafer-level packaging (WLP) process described in this paper allows quasi-hermetic capping of optical devices on wafer-level yielding miniaturized glass cavity windows on top of the optical area, at the same time leaving the contact area accessible for standard electrical connections i.e. wire bond. These smaller chip-size optical cavity packages are used within standard chip-on-board (COB) assemblies for high performance optical applications providing high yield and utmost reliability. In this paper the process flow of generating optical cavity glass wafers as well as of the wafer-level capping process is demonstrated and reliability data on wafer-level and package-level are discussed.
  • Keywords
    chip-on-board packaging; glass; reliability; wafer level packaging; advanced optical COB packaging; chip-on-board assemblies; chip-size optical cavity packages; electrical connections; glass cavity windows; optical cavity glass wafers; quasihermetic capping; wafer-level glass capping; wafer-level packaging process; Assembly; Contacts; Glass; Image motion analysis; Optical devices; Packaging; Wafer bonding; Wafer scale integration; Windows; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.373857
  • Filename
    4249943