DocumentCode
2877972
Title
Wafer-Level Glass Capping as Drop-in for Miniaturized, Advanced Optical COB Packaging
Author
Seidemann, Volker ; Gyenge, Oliver ; Hansen, Ulli ; Heuser, Thorsten ; Maus, Simon ; Mund, Dietrich ; Espertshuber, Klaus ; Wilke, Ralph ; Leib, Jürgen
Author_Institution
SCHOTT Electron. GmbH, Berlin
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
600
Lastpage
604
Abstract
The novel wafer-level packaging (WLP) process described in this paper allows quasi-hermetic capping of optical devices on wafer-level yielding miniaturized glass cavity windows on top of the optical area, at the same time leaving the contact area accessible for standard electrical connections i.e. wire bond. These smaller chip-size optical cavity packages are used within standard chip-on-board (COB) assemblies for high performance optical applications providing high yield and utmost reliability. In this paper the process flow of generating optical cavity glass wafers as well as of the wafer-level capping process is demonstrated and reliability data on wafer-level and package-level are discussed.
Keywords
chip-on-board packaging; glass; reliability; wafer level packaging; advanced optical COB packaging; chip-on-board assemblies; chip-size optical cavity packages; electrical connections; glass cavity windows; optical cavity glass wafers; quasihermetic capping; wafer-level glass capping; wafer-level packaging process; Assembly; Contacts; Glass; Image motion analysis; Optical devices; Packaging; Wafer bonding; Wafer scale integration; Windows; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location
Reno, NV
ISSN
0569-5503
Print_ISBN
1-4244-0985-3
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2007.373857
Filename
4249943
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