Title :
Wafer-Level Glass Capping as Drop-in for Miniaturized, Advanced Optical COB Packaging
Author :
Seidemann, Volker ; Gyenge, Oliver ; Hansen, Ulli ; Heuser, Thorsten ; Maus, Simon ; Mund, Dietrich ; Espertshuber, Klaus ; Wilke, Ralph ; Leib, Jürgen
Author_Institution :
SCHOTT Electron. GmbH, Berlin
fDate :
May 29 2007-June 1 2007
Abstract :
The novel wafer-level packaging (WLP) process described in this paper allows quasi-hermetic capping of optical devices on wafer-level yielding miniaturized glass cavity windows on top of the optical area, at the same time leaving the contact area accessible for standard electrical connections i.e. wire bond. These smaller chip-size optical cavity packages are used within standard chip-on-board (COB) assemblies for high performance optical applications providing high yield and utmost reliability. In this paper the process flow of generating optical cavity glass wafers as well as of the wafer-level capping process is demonstrated and reliability data on wafer-level and package-level are discussed.
Keywords :
chip-on-board packaging; glass; reliability; wafer level packaging; advanced optical COB packaging; chip-on-board assemblies; chip-size optical cavity packages; electrical connections; glass cavity windows; optical cavity glass wafers; quasihermetic capping; wafer-level glass capping; wafer-level packaging process; Assembly; Contacts; Glass; Image motion analysis; Optical devices; Packaging; Wafer bonding; Wafer scale integration; Windows; Wire;
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2007.373857