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Author

Donlin, Noel E.

fYear

1991

fDate

26-30 Oct 1991

Firstpage

1114

Keywords

Acceleration; Aging; Costs; Failure analysis; Production; Semiconductor device reliability; Semiconductor devices; Steady-state; Stress; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1991, Proceedings., International

ISSN

1089-3539

Print_ISBN

0-8186-9156-5

Type

DOI

10.1109/TEST.1991.519789

Filename

519789

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