Title :
Superresolution image enhancement in digital photomicrography by subpixel translation using a scanning micromirror
Author :
Yu, Kyoungsik ; Park, Namkyoo ; Lee, Daesung ; Solgaard, Olav
Author_Institution :
Korea Electr. Eng. & Sci. Res. Inst., Seoul Nat. Univ., Seoul
Abstract :
We report on a superresolution image enhancement technique that can improve the spatial resolution of digital photomicrography employing typical pixelated image sensors. A bulk-micromachined micromirror is used to control the image location with subpixel accuracy.
Keywords :
digital photography; image enhancement; image resolution; image sensors; micromirrors; bulk-micromachined micromirror; digital photomicrography; image location; pixelated image sensors; spatial resolution; subpixel accuracy; superresolution image enhancement; Image enhancement; Image resolution; Image sensors; Micromirrors; Optical films; Optical sensors; Optical signal processing; Photomicrography; Signal resolution; Spatial resolution; (100.2980) Image enhancement; (100.6640) Superresolution;
Conference_Titel :
Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on
Conference_Location :
Long Beach, CA
Print_ISBN :
978-1-55752-813-1
Electronic_ISBN :
978-1-55752-813-1
DOI :
10.1109/CLEO.2006.4628646
