Title :
EE CURRICULUM - CONTINUOUS PROCESS IMPROVEMENT?
Author :
Hawkins, Charles F. ; Williams, Richard H.
Keywords :
Circuit testing; Concurrent engineering; Costs; Design engineering; Design for testability; Engineering education; Environmental economics; Manufacturing; Product design; Reliability engineering;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519792