DocumentCode
2878136
Title
Are Intermetallics in Solder Joints Really Brittle?
Author
Lee, Chin C. ; Wang, Pin J. ; Kim, Jong S.
Author_Institution
Univ. of California at Irvine, Irvine
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
648
Lastpage
652
Abstract
In nearly all soldering processes, it is the intermetallic (IMC) layer that bonds the solder to the base metal. Thus, the IMC layer is necessary for any successful soldering operation used in the electronic industry. That is, a solder joint always has at least one IMC layer. While the IMC layer is needed, it is not static. It grows in subsequent reflows and during aging with time. Its growth without control could have adverse effect on the reliability. This is particularly true for flip-chip solder joints. The IMC, while necessary, seems to have also brought some problems. Thus, many packaging and solder experts believe that "the intermetallics are brittle and they can often embrittle the solder joints". On the other hand, not one really presents quantitative analysis to illustrate that the IMC is indeed brittle. No one really interprets what it means by "brittle." In this paper, we collect and review the physical properties of four commonly seen intermetallics: Cu6Sn5, Cu3Sn, Ni3Sn4, and AuSn4. These properties are compared with that of reference materials Cu and Sn3.5Ag solder. Based on the measured properties available, we analyze and evaluate whether these IMCs are indeed brittle. Based on the fracture of flip chip solder joints reported by others, we assess whether the fracture is caused by the "brittle" nature of the intermetallic as many believe or by something else.
Keywords
ageing; brittle fracture; copper alloys; flip-chip devices; gold alloys; nickel alloys; reliability; soldering; tin alloys; AuSn4; Cu3Sn; Cu6Sn5; Ni3Sn4; aging; brittle fracture; circuit reliability; electronic industry; flip-chip solder joints; intermetallic layer; soldering processes; Aging; Computer science; Copper; Electronics industry; Flip chip solder joints; Intermetallic; Packaging; Soldering; Steel; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location
Reno, NV
ISSN
0569-5503
Print_ISBN
1-4244-0985-3
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2007.373866
Filename
4249952
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