• DocumentCode
    2878136
  • Title

    Are Intermetallics in Solder Joints Really Brittle?

  • Author

    Lee, Chin C. ; Wang, Pin J. ; Kim, Jong S.

  • Author_Institution
    Univ. of California at Irvine, Irvine
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    648
  • Lastpage
    652
  • Abstract
    In nearly all soldering processes, it is the intermetallic (IMC) layer that bonds the solder to the base metal. Thus, the IMC layer is necessary for any successful soldering operation used in the electronic industry. That is, a solder joint always has at least one IMC layer. While the IMC layer is needed, it is not static. It grows in subsequent reflows and during aging with time. Its growth without control could have adverse effect on the reliability. This is particularly true for flip-chip solder joints. The IMC, while necessary, seems to have also brought some problems. Thus, many packaging and solder experts believe that "the intermetallics are brittle and they can often embrittle the solder joints". On the other hand, not one really presents quantitative analysis to illustrate that the IMC is indeed brittle. No one really interprets what it means by "brittle." In this paper, we collect and review the physical properties of four commonly seen intermetallics: Cu6Sn5, Cu3Sn, Ni3Sn4, and AuSn4. These properties are compared with that of reference materials Cu and Sn3.5Ag solder. Based on the measured properties available, we analyze and evaluate whether these IMCs are indeed brittle. Based on the fracture of flip chip solder joints reported by others, we assess whether the fracture is caused by the "brittle" nature of the intermetallic as many believe or by something else.
  • Keywords
    ageing; brittle fracture; copper alloys; flip-chip devices; gold alloys; nickel alloys; reliability; soldering; tin alloys; AuSn4; Cu3Sn; Cu6Sn5; Ni3Sn4; aging; brittle fracture; circuit reliability; electronic industry; flip-chip solder joints; intermetallic layer; soldering processes; Aging; Computer science; Copper; Electronics industry; Flip chip solder joints; Intermetallic; Packaging; Soldering; Steel; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.373866
  • Filename
    4249952