DocumentCode :
2878152
Title :
CMOS bridging fault detection
Author :
Storey, T.M. ; Maly, W.
fYear :
1991
fDate :
26-30 Oct. 1991
Firstpage :
1123
Keywords :
Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Integrated circuit testing; Logic testing; Monitoring; Switches; Switching circuits; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
Conference_Location :
Nashville, TN, USA
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519796
Filename :
519796
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2878152