DocumentCode :
2878169
Title :
Drop Shock Reliability of Lead-Free Alloys - Effect of Micro-Additives
Author :
Pandher, Ranjit S. ; Lewis, Brian G. ; Vangaveti, Raghasudha ; Singh, Bawa
Author_Institution :
Cookson Electron., Jersey City
fYear :
2007
fDate :
May 29 2007-June 1 2007
Firstpage :
669
Lastpage :
676
Abstract :
The drop shock reliability of solder joints has become a major issue for the electronic industry partly because of the ever increasing popularity of portable electronics and partly due the transition to lead free solders. Most of the commonly recommended lead-free are high Sn alloys which have relatively higher strength and modulus. This plays a critical role in the reliability of Pb-free solder joints. Further, even though metallugically it is the Sn in the solder alloys that principally participates in the solder joint formation, details of the IMC layers formed with SnPb and Pb-free alloys are different. The markedly different process conditions for SnPb and Pb-free alloys also bear on solder joint quality. Brittle failure of solder joints in drop shock occurs at or in the interfacial IMC layer(s). This is due to the inherent brittle nature of the IMC, defects within or at IMC interfaces or transfer of stress to the interfaces as a result of the low ductility of the bulk solder. In developing improved performance alloys, Cookson Electronics has addressed both issues -improved ductility and modification and control of the intermetallic layer. A broad range of base alloy compositions together with selected micro-alloying additions to SnAgCu alloys have been evaluated with the objective of controlling bulk alloy mechanical properties and the diffusion processes operating in the formation and growth of the intermetallic interfacial layer(s). In the present article a detailed study of a range of micro-alloy additives is presented. The alloy additives generally act as diffusion modifiers slowing interdiffusion between substrates and solder thereby reducing IMC thickness or the propensity for void formation. Alternatively additions can be made that act as diffusion compensatorscopy. It should be noted that the level of the micro-additions does not measurably modify the bulk mechanical properties of the base alloys. Our results show that dramatic improvements - in the solder joint reliability, as demonstrated by high-speed ball pull and drop shock tests, can be achieved.
Keywords :
brittle fracture; mechanical testing; reliability; solders; IMC interfaces; Pb-free solder joints; SnAgCu alloys; SnPb; SnPb alloys; base alloy compositions; base alloys; brittle failure; brittle nature; bulk alloy mechanical properties; diffusion compensators; diffusion modifiers; diffusion process; drop shock reliability; drop shock tests; electronic industry; high-speed ball pull test; interfacial IMC layer; intermetallic interfacial layer; lead free solders; lead-free alloys; microadditives; microalloy additives; microalloying additions; solder joint formation; solder joint quality; solder joint reliability; void formation; Additives; Electric shock; Electronics industry; Environmentally friendly manufacturing techniques; Industrial electronics; Intermetallic; Lead; Mechanical factors; Soldering; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
ISSN :
0569-5503
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2007.373868
Filename :
4249954
Link To Document :
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