• DocumentCode
    2878169
  • Title

    Drop Shock Reliability of Lead-Free Alloys - Effect of Micro-Additives

  • Author

    Pandher, Ranjit S. ; Lewis, Brian G. ; Vangaveti, Raghasudha ; Singh, Bawa

  • Author_Institution
    Cookson Electron., Jersey City
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    669
  • Lastpage
    676
  • Abstract
    The drop shock reliability of solder joints has become a major issue for the electronic industry partly because of the ever increasing popularity of portable electronics and partly due the transition to lead free solders. Most of the commonly recommended lead-free are high Sn alloys which have relatively higher strength and modulus. This plays a critical role in the reliability of Pb-free solder joints. Further, even though metallugically it is the Sn in the solder alloys that principally participates in the solder joint formation, details of the IMC layers formed with SnPb and Pb-free alloys are different. The markedly different process conditions for SnPb and Pb-free alloys also bear on solder joint quality. Brittle failure of solder joints in drop shock occurs at or in the interfacial IMC layer(s). This is due to the inherent brittle nature of the IMC, defects within or at IMC interfaces or transfer of stress to the interfaces as a result of the low ductility of the bulk solder. In developing improved performance alloys, Cookson Electronics has addressed both issues -improved ductility and modification and control of the intermetallic layer. A broad range of base alloy compositions together with selected micro-alloying additions to SnAgCu alloys have been evaluated with the objective of controlling bulk alloy mechanical properties and the diffusion processes operating in the formation and growth of the intermetallic interfacial layer(s). In the present article a detailed study of a range of micro-alloy additives is presented. The alloy additives generally act as diffusion modifiers slowing interdiffusion between substrates and solder thereby reducing IMC thickness or the propensity for void formation. Alternatively additions can be made that act as diffusion compensatorscopy. It should be noted that the level of the micro-additions does not measurably modify the bulk mechanical properties of the base alloys. Our results show that dramatic improvements - in the solder joint reliability, as demonstrated by high-speed ball pull and drop shock tests, can be achieved.
  • Keywords
    brittle fracture; mechanical testing; reliability; solders; IMC interfaces; Pb-free solder joints; SnAgCu alloys; SnPb; SnPb alloys; base alloy compositions; base alloys; brittle failure; brittle nature; bulk alloy mechanical properties; diffusion compensators; diffusion modifiers; diffusion process; drop shock reliability; drop shock tests; electronic industry; high-speed ball pull test; interfacial IMC layer; intermetallic interfacial layer; lead free solders; lead-free alloys; microadditives; microalloy additives; microalloying additions; solder joint formation; solder joint quality; solder joint reliability; void formation; Additives; Electric shock; Electronics industry; Environmentally friendly manufacturing techniques; Industrial electronics; Intermetallic; Lead; Mechanical factors; Soldering; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.373868
  • Filename
    4249954