DocumentCode :
2878186
Title :
Failure of gold and copper ball bonds due to intermetallic oxidation and corrosion
Author :
Breach, C.D. ; Shen, Ng Hun ; Lee, Teck Kheng ; Holliday, R.
Author_Institution :
ProMat Consultants, Singapore, Singapore
fYear :
2011
fDate :
4-7 July 2011
Firstpage :
1
Lastpage :
6
Abstract :
Strong interest in the replacement of gold bonding wire by copper in microelectronics packaging has highlighted poor performance of copper wire under moist conditions. Attempts have been made to address this problem by coating copper wire with palladium, which may be a solution for some applications but ignores the fundamental reasons for the poor performance of copper wire. Gold and copper ball bonds were isothermally aged under moist conditions (85°C and 85% relative humidity (RH)) in an effort to better understand the corrosion mechanisms. This paper presents ideas on the origins of the moisture sensitivity of copper and gold ball bonds on aluminium alloy bond pads, drawing on experimental data from this study, results from recently published literature and established knowledge on moisture induced degradation of intermetallics.
Keywords :
ageing; aluminium alloys; copper; corrosion protective coatings; electronics packaging; failure analysis; gold; lead bonding; oxidation; palladium; Au; Cu; Pd; aluminium alloy bond pads; copper ball bonds; copper wire coating; corrosion mechanisms; failure; gold ball bonds; gold bonding wire; intermetallic oxidation; isothermal aging; microelectronics packaging; moist conditions; moisture sensitivity; palladium; Aluminum; Copper; Corrosion; Gold; Intermetallic; Moisture; Oxidation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the
Conference_Location :
Incheon
ISSN :
1946-1542
Print_ISBN :
978-1-4577-0159-7
Electronic_ISBN :
1946-1542
Type :
conf
DOI :
10.1109/IPFA.2011.5992790
Filename :
5992790
Link To Document :
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