• DocumentCode
    2878220
  • Title

    Dynamic Crack Propagation Prediction of Solder Joints under Impact Conditions

  • Author

    Towashiraporn, Pongpinit ; Crosbie, Paul ; Brown, Matt ; Cavallaro, Alberto

  • Author_Institution
    Motorola Inc., Libertyville
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    689
  • Lastpage
    694
  • Abstract
    Failure predictive modeling based on cohesive constitutive relation is used to study the effect of solder-joint array geometry on the integrity of live solder joints. The dynamic overstress state and crack propagation of the interface between the solder and the pad results in complete interface separation. This failure mode is predominant under impact conditions and is captured accurately by a numerical model. Package-level drop tests were simulated and experimentally validated by a 4-point dynamic bend system.
  • Keywords
    crack detection; failure (mechanical); impact (mechanical); solders; dynamic crack propagation; failure predictive modeling; impact conditions; solder-joint array geometry; Aluminum alloys; Assembly; Capacitive sensors; Creep; Integrated circuit interconnections; Materials reliability; Packaging; Soldering; Stress; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.373871
  • Filename
    4249957