Title :
Silicon-Based, Multi-Chip LED Package
Author :
Jeung, Won Kyu ; Shin, Sang Hyun ; Hong, Suk Youn ; Choi, Seog Moon ; Yi, Sung ; Yoon, Young Bok ; Kim, Hyun Jun ; Lee, Sung Jun ; Par, Ki Yeol
Author_Institution :
Samsung Electro-Mech. Co., Ltd., Suwon
fDate :
May 29 2007-June 1 2007
Abstract :
A new silicon based multi chip white LED PKG for high power application is designed, fabricated and tested. The package is composed of Al layer coated reflector cup, silicon base which has micro through via hole for interconnection, and micro lens. Compared to the most conventional single chip LED PKG, multi chip white LED PKG has many advantages in cost, density, size, thermal resistance and optical efficiency. After numerical analysis, silicon based multi chip LED PKG which has 9 mm times 9 mm with 0.65 mm size is fabricated using simple MEMS technology. The thermal resistance of this new silicon package was about 4-5 K/W from junction to case in simulation and this result could be comparable to that of other high power LED package. Also, this PKG platform has over than 60% increase in optical extraction efficiency. The proposed multi chip LED PKG can find applications, such as a next generation solid state lighting, back light units and etc.
Keywords :
aluminium; elemental semiconductors; integrated circuit design; integrated circuit testing; light emitting diodes; light sources; micromachining; multichip modules; power electronics; silicon; thermal resistance; wafer level packaging; Al; MEMS technology; Si; back light units; high power application; microlens; numerical analysis; optical extraction efficiency; silicon based multichip LED packaging; silicon reflector; size 0.65 mm; size 9 mm; solid state lighting; thermal resistance; Costs; Lenses; Light emitting diodes; Micromechanical devices; Numerical analysis; Optical interconnections; Packaging; Silicon; Testing; Thermal resistance;
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2007.373876