Title :
The HEMP coupling effect of protective engineering´s entrance
Author :
Feng, Lu ; Bin, Chen ; Bihua, Zhou
Author_Institution :
Electromagn. Lab., Nanjing Eng. Inst.
Abstract :
In this paper, four coupling effect models of protective engineering´s entrance are set up by using FDTD method and modified generalized total-field/scattered-field boundary. HEMP coupling effect of shielding gate and thin-slot on shielding gate are studied, and some valuable conclusions are obtained
Keywords :
electromagnetic coupling; electromagnetic fields; electromagnetic pulse; electromagnetic shielding; electromagnetic wave scattering; finite difference time-domain analysis; FDTD method; HEMP coupling effect; generalized total-field; protective engineering entrance; scattered-field boundary; shielding gate; EMP radiation effects; Electromagnetic coupling; Electromagnetic diffraction; Electromagnetic modeling; Electromagnetic propagation; Electromagnetic scattering; Explosions; Finite difference methods; Protection; Testing; HEMP (high-altitude electromagnetic pulse); electromagnetic coupling effect; modified generalized total-field/scattered-field boundary;
Conference_Titel :
Environmental Electromagnetics, The 2006 4th Asia-Pacific Conference on
Conference_Location :
Dalian
Print_ISBN :
1-4244-0183-6
DOI :
10.1109/CEEM.2006.257907
