DocumentCode :
2878856
Title :
A programmable 256K CMOS EPROM with on-chip test circuits
Author :
Tanaka, Shoji ; Atsumi, S. ; Momodomi, M. ; Shinada, K. ; Yoshikawa, Kenichi ; Nagakubo, Y. ; Kanzaki, K.
Author_Institution :
Toshiba Semiconductor Device Engineering Lab, Kawasaki, Japan
Volume :
XXVII
fYear :
1984
fDate :
22-24 Feb. 1984
Firstpage :
148
Lastpage :
149
Keywords :
CMOS technology; Circuit testing; EPROM; Energy consumption; Laboratories; Power engineering and energy; Semiconductor devices; Stress control; Threshold voltage; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1984 IEEE International
Conference_Location :
San Francisco, CA, USA
Type :
conf
DOI :
10.1109/ISSCC.1984.1156605
Filename :
1156605
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2878856
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