Title :
A pipelined 32b NMOS microprocessor
Author :
Rowen, C. ; Przbylski, S. ; Jouppi, N. ; Gross, T. ; Shott, J. ; Hennessy, J.
Author_Institution :
Stanford University, Stanford, CA, USA
Keywords :
Circuit testing; Computer aided instruction; Decoding; Fabrication; MOS devices; Microprocessors; Pipelines; Registers; Semiconductor device measurement; Very large scale integration;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1984 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1984.1156607
