Title :
Status, future and standardization of EEPROMs
Author :
Lancaster, Adam ; Salsbury, P.
Author_Institution :
RCA Solid State, Somerville, NJ, USA
Abstract :
Large bit density EEPROMs are becoming available from multiple vendors. The structures of these devices are based on many diverse technologies, and provide many different features. Potential users are faced with many difficult choices. Panelists will discuss this profileration of approaches, the relative merits of each and address the standardization problem.
Keywords :
Battery management systems; Control systems; EPROM; Memory management; Project management; Research and development management; Solid state circuits; Standardization; Technology management; Testing;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1984 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1984.1156612
