DocumentCode
2878995
Title
Far-field OTR and ODR images produced by 7-GeV electron beams at APS
Author
Lumpkin, A.H. ; Yang, B.X. ; Berg, W.J. ; Sereno, N.S. ; Yao, C.-Y. ; Rule, D.W.
Author_Institution
Argonne Accel. Inst., Argonne
fYear
2007
fDate
25-29 June 2007
Firstpage
4372
Lastpage
4374
Abstract
We have investigated the angular distribution patterns (far-field focus) of optical transition radiation (OTR) and optical diffraction radiation (ODR) generated by 7-GeV electron beams passing through and near an Al metal plane, respectively. The 70-murad opening angles of the OTR patterns provide calibration factors for the system. Effects of the upstream quadrupole focusing strength on the patterns as well as polarization effects were observed. The OTR data are compared to an existing OTR single-foil model, while ODR profile results are compared to expressions for single-edge diffraction. ODR was studied with impact parameters of about 1.25 mm, close to the gamma lambda-bar value of 1.4 mm for 628-nm radiation. We expect angle-pointing information along the x axis parallel to the mirror edge is available from the single-lobe ODR data as well as divergence information at the sub-100-murad level. Experimental and model results will be presented.
Keywords
electron accelerators; electron beams; light diffraction; light polarisation; optical focusing; optical images; particle beam diagnostics; storage rings; APS; Advanced Photon Source; ODR images; aluminium metal plane; angular distribution patterns; beam position monitors; calibration factors; electron beams; electron volt energy 7 GeV; far-field OTR images; impact parameters; mirror edge; optical diffraction radiation; optical transition radiation; polarization effects; single-edge diffraction; single-foil model; storage ring; upstream quadrupole focusing strength; Electron beams; Focusing; Laser beams; Mirrors; Monitoring; Optical diffraction; Optical imaging; Optical sensors; Performance evaluation; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2007. PAC. IEEE
Conference_Location
Albuquerque, NM
Print_ISBN
978-1-4244-0916-7
Type
conf
DOI
10.1109/PAC.2007.4440011
Filename
4440011
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