DocumentCode :
2879006
Title :
A Simple Method to Calculate Electric Field Distribution and Characteristic ImpedanceIn ATEM Cell With Thin Metallic EUT
Author :
Jinlong, Xian ; Haiyan, Wu ; Guoping, Li ; Xiannian, Shen
Author_Institution :
Dept. of Electrons Sci., Henan Univ. of Technol.
fYear :
2006
fDate :
1-4 Aug. 2006
Firstpage :
211
Lastpage :
213
Abstract :
ATEM cell is widely used in electromagnetic compatibility (EMC) test. When loaded with equipment under test (EUT), the electric field in ATEM cell will be distorted , and the characteristic impedance changed. In this paper, the field distribution and characteristic impedance in ATEM cell loaded with thin metallic EUT is analyzed by a simple method - point matching method. The section of an asymmetric TEM was divided into three regions and potential function is expressed as a Fourier series in each region. The point-matching was used on the interface of these regions to determine coefficients of series. Thus, the characteristic impedance can be calculated and electric field obtained in terms of a potential function
Keywords :
Fourier series; TEM cells; electric fields; electromagnetic compatibility; ATEM cell; EMC; Fourier series; characteristic impedance; electric field distribution; electromagnetic compatibility; equipment under test; point matching method; thin metallic EUT; Capacitance; Electromagnetic compatibility; Electromagnetic fields; Equations; Finite element methods; Fourier series; Impedance; TEM cells; Testing; Transmission lines; Characteristic impedance; EUT; TEM cell; electric field distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Environmental Electromagnetics, The 2006 4th Asia-Pacific Conference on
Conference_Location :
Dalian
Print_ISBN :
1-4244-0183-6
Type :
conf
DOI :
10.1109/CEEM.2006.257938
Filename :
4027270
Link To Document :
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