• DocumentCode
    2879006
  • Title

    A Simple Method to Calculate Electric Field Distribution and Characteristic ImpedanceIn ATEM Cell With Thin Metallic EUT

  • Author

    Jinlong, Xian ; Haiyan, Wu ; Guoping, Li ; Xiannian, Shen

  • Author_Institution
    Dept. of Electrons Sci., Henan Univ. of Technol.
  • fYear
    2006
  • fDate
    1-4 Aug. 2006
  • Firstpage
    211
  • Lastpage
    213
  • Abstract
    ATEM cell is widely used in electromagnetic compatibility (EMC) test. When loaded with equipment under test (EUT), the electric field in ATEM cell will be distorted , and the characteristic impedance changed. In this paper, the field distribution and characteristic impedance in ATEM cell loaded with thin metallic EUT is analyzed by a simple method - point matching method. The section of an asymmetric TEM was divided into three regions and potential function is expressed as a Fourier series in each region. The point-matching was used on the interface of these regions to determine coefficients of series. Thus, the characteristic impedance can be calculated and electric field obtained in terms of a potential function
  • Keywords
    Fourier series; TEM cells; electric fields; electromagnetic compatibility; ATEM cell; EMC; Fourier series; characteristic impedance; electric field distribution; electromagnetic compatibility; equipment under test; point matching method; thin metallic EUT; Capacitance; Electromagnetic compatibility; Electromagnetic fields; Equations; Finite element methods; Fourier series; Impedance; TEM cells; Testing; Transmission lines; Characteristic impedance; EUT; TEM cell; electric field distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environmental Electromagnetics, The 2006 4th Asia-Pacific Conference on
  • Conference_Location
    Dalian
  • Print_ISBN
    1-4244-0183-6
  • Type

    conf

  • DOI
    10.1109/CEEM.2006.257938
  • Filename
    4027270