DocumentCode
2879006
Title
A Simple Method to Calculate Electric Field Distribution and Characteristic ImpedanceIn ATEM Cell With Thin Metallic EUT
Author
Jinlong, Xian ; Haiyan, Wu ; Guoping, Li ; Xiannian, Shen
Author_Institution
Dept. of Electrons Sci., Henan Univ. of Technol.
fYear
2006
fDate
1-4 Aug. 2006
Firstpage
211
Lastpage
213
Abstract
ATEM cell is widely used in electromagnetic compatibility (EMC) test. When loaded with equipment under test (EUT), the electric field in ATEM cell will be distorted , and the characteristic impedance changed. In this paper, the field distribution and characteristic impedance in ATEM cell loaded with thin metallic EUT is analyzed by a simple method - point matching method. The section of an asymmetric TEM was divided into three regions and potential function is expressed as a Fourier series in each region. The point-matching was used on the interface of these regions to determine coefficients of series. Thus, the characteristic impedance can be calculated and electric field obtained in terms of a potential function
Keywords
Fourier series; TEM cells; electric fields; electromagnetic compatibility; ATEM cell; EMC; Fourier series; characteristic impedance; electric field distribution; electromagnetic compatibility; equipment under test; point matching method; thin metallic EUT; Capacitance; Electromagnetic compatibility; Electromagnetic fields; Equations; Finite element methods; Fourier series; Impedance; TEM cells; Testing; Transmission lines; Characteristic impedance; EUT; TEM cell; electric field distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Environmental Electromagnetics, The 2006 4th Asia-Pacific Conference on
Conference_Location
Dalian
Print_ISBN
1-4244-0183-6
Type
conf
DOI
10.1109/CEEM.2006.257938
Filename
4027270
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