DocumentCode :
2879108
Title :
Ionization energy shift in iridium measured with a lutetium edge filter
Author :
Pereira, N.R. ; Jackson, S. ; Schumer, J.W. ; Seely, J.F. ; Weber, B.V. ; Hudson, T.L.
Author_Institution :
Ecopulse, Inc., Springfield, VA, USA
fYear :
2011
fDate :
26-30 June 2011
Firstpage :
1
Lastpage :
1
Abstract :
Summary form only given. In an ionized atom the Kα and Kβ fluorescence lines have different, and usually slightly higher, energies than the same lines in a cold, un-ionized atom. The increase in fluorescence line energy Δ(hν) that pulsed power discharges can produce in high atomic number atoms is usually much smaller than the line energies hν themselves: typical numbers are hν = 60 keV and Δ(hν) = 10-20 eV, while the resolution obtained so far with a transmission crystal spectrometer developed for the purpose is around 100 eV. Hence any change in the energy of the fluorescence X-rays, from tungsten weakly ionized in the tungsten of the Plasma-Filled Rod Pinch (PFRP), could not be observed. It may be possible to enhance the crystal spectrometer´s resolution with a detector that has smaller pixel sizes and faster time resolution, but not within the available funding. However, a spectrometer´s effective resolution can sometimes be increased by supplementing the primary instrument with an additional element that does provide the necessary resolution albeit with other restrictions such as a narrower energy range. For the X-rays of interest here one possibility is an edge filter. Tungsten´s Kα1 at 59.3128 keV is closest to the edge in thulium, at 59.390 keV, but at Δ=78 eV too far away in energy. The pair that is closest is the Kα2 line of iridium at 63.2867 keV and the K-edge of lutetium, at 63.314 keV, at Δ=27 eV. How a Lu K-edge filter affects the transmission of the Ir Kα2 line depends not only on the difference between the nominal edge and line energy, but also on the edge and line shapes. Both are life-time broadened, by tens of eV. The paper discusses the estimate of the sensitivity, a 10 % decrease in line intensity for a 10 eV shift, and any results that may have been obtained to date on an iridium PFRP. If the technique works it could- be used to estimate the ionization on the inside of a NIF hohlraum capsule.
Keywords :
X-ray emission spectra; fluorescence; ionisation potential; iridium; pinch effect; plasma diagnostics; Ir; K-alpha fluorescence line; K-beta fluorescence line; NIF hohlraum capsule; crystal spectrometer resolution enhancement; edge shape; electron volt energy 63.2867 keV; electron volt energy 63.314 keV; fluorescence X-ray energy change; fluorescence line energy; high atomic number atoms; ionized atom; iridium K-alpha2 line transmission; iridium PFRP; iridium ionization energy shift; line shape; lutetium K-edge filter; lutetium edge filter; nominal edge; plasma filled rod pinch; pulsed power discharges; spectrometer effective resolution; Image edge detection; Lutetium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science (ICOPS), 2011 Abstracts IEEE International Conference on
Conference_Location :
Chicago, IL
ISSN :
0730-9244
Print_ISBN :
978-1-61284-330-8
Electronic_ISBN :
0730-9244
Type :
conf
DOI :
10.1109/PLASMA.2011.5992916
Filename :
5992916
Link To Document :
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