• DocumentCode
    2879154
  • Title

    Experimental and Numerical Study of the Effect of Viscoelasticity on Delamination in a Plastic IC Package

  • Author

    Guojun, Hu ; Tay, Andrew A O ; Yongwei, Zhang ; Chew, Spencer

  • Author_Institution
    Cookson Semicond. Packaging Mater., Singapore
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    1062
  • Lastpage
    1068
  • Abstract
    Over the glass transition temperature, epoxy molding compound strongly exhibits viscoelastic behavior which causes its Young´s modulus to be not only temperature-dependent but also time-dependent. In the present study, the viscoelastic properties of epoxy molding compound such as Prony coefficients, relaxation time and time-temperature shift factors are used for the delamination analysis. At the same time, end-notched flexure tests have been conducted at high temperatures under different loading rates for the investigation of the effect of viscoelasticity on the interface delamination between epoxy molding compound and copper. It is found that the energy release rate can still be a criterion for the viscoelastic bimaterial interface crack problem during lead-free solder reflow process. Furthermore, the critical energy release rate is rate-dependent and usually the critical energy release rate increases with the increase of loading rate for the interface delamination between epoxy molding compound and copper.
  • Keywords
    Young´s modulus; delamination; glass transition; integrated circuit packaging; reflow soldering; solders; viscoelasticity; Prony coefficients; Young modulus; delamination analysis; end-notched flexure tests; energy release rate; epoxy molding compound; glass transition temperature; lead-free solder reflow process; plastic IC package delamination; viscoelastic bimaterial interface crack problem; Copper; Delamination; Elasticity; Environmentally friendly manufacturing techniques; Glass; Lead; Plastic integrated circuit packaging; Temperature; Testing; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.373929
  • Filename
    4250015