DocumentCode
2879154
Title
Experimental and Numerical Study of the Effect of Viscoelasticity on Delamination in a Plastic IC Package
Author
Guojun, Hu ; Tay, Andrew A O ; Yongwei, Zhang ; Chew, Spencer
Author_Institution
Cookson Semicond. Packaging Mater., Singapore
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
1062
Lastpage
1068
Abstract
Over the glass transition temperature, epoxy molding compound strongly exhibits viscoelastic behavior which causes its Young´s modulus to be not only temperature-dependent but also time-dependent. In the present study, the viscoelastic properties of epoxy molding compound such as Prony coefficients, relaxation time and time-temperature shift factors are used for the delamination analysis. At the same time, end-notched flexure tests have been conducted at high temperatures under different loading rates for the investigation of the effect of viscoelasticity on the interface delamination between epoxy molding compound and copper. It is found that the energy release rate can still be a criterion for the viscoelastic bimaterial interface crack problem during lead-free solder reflow process. Furthermore, the critical energy release rate is rate-dependent and usually the critical energy release rate increases with the increase of loading rate for the interface delamination between epoxy molding compound and copper.
Keywords
Young´s modulus; delamination; glass transition; integrated circuit packaging; reflow soldering; solders; viscoelasticity; Prony coefficients; Young modulus; delamination analysis; end-notched flexure tests; energy release rate; epoxy molding compound; glass transition temperature; lead-free solder reflow process; plastic IC package delamination; viscoelastic bimaterial interface crack problem; Copper; Delamination; Elasticity; Environmentally friendly manufacturing techniques; Glass; Lead; Plastic integrated circuit packaging; Temperature; Testing; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location
Reno, NV
ISSN
0569-5503
Print_ISBN
1-4244-0985-3
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2007.373929
Filename
4250015
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