Title :
NiosII Soft-Core Processor Implementation in the Moving Controlling System of ESD Pole
Author :
Wenbing, Liu ; Shanghe, Liu ; Liang, Yuan
Author_Institution :
Inst. of Electrostatic & Electromagn. Protection, Mech. Eng. Coll.
Abstract :
In dealing with the frequently happened problem of partially failure in the common VLSI chips under strong EMI environment, a method of the hardening of the logic core for the controlling system is offered based on NiosII soft-core technology. This method both improved fundamentally the normal used protecting methods for the traditional control systems, and structurally enhanced the reliability of the control system under ESD environment
Keywords :
VLSI; electrical engineering computing; electromagnetic interference; electrostatic discharge; hardware-software codesign; EMI; ESD pole; NiosII soft-core processor; VLSI chips; Concrete; Control systems; Electromagnetic interference; Electrostatic discharge; Field programmable gate arrays; Immunity testing; Logic devices; Logic programming; Protection; Pulse width modulation; EMI; ESD; FPGA; Moving Controlling System; NiosII Soft-Core Processor;
Conference_Titel :
Environmental Electromagnetics, The 2006 4th Asia-Pacific Conference on
Conference_Location :
Dalian
Print_ISBN :
1-4244-0183-6
DOI :
10.1109/CEEM.2006.257955
