DocumentCode :
2879551
Title :
Wideband and High-Isolation Properties of Power Bus Structure by the Combination of Thin-Film Embedded Capacitor and Planar EBG Structure
Author :
Sudo, Toshio ; Ichijo, Seiju ; Kushihira, Takanobu
Author_Institution :
Toshiba Corp., Yokohama
fYear :
2007
fDate :
May 29 2007-June 1 2007
Firstpage :
1212
Lastpage :
1217
Abstract :
Power bus structure in a printed circuit board (PCB) is an influential design parameter in mitigating power/ground fluctuation and radiated emission for high-speed digital circuits. The power bus is ordinarily composed of two solid planes separated by dielectric insulator in a multilayer PCB. Recently, it has been reported that an electromagnetic band-gap (EBG)-type VDD plane is effective for suppressing radiated emission for mixed-signal applications or high-speed digital applications. However, the EBG-type VDD plane often induces large power/ground bounce due to the return current discontinuity. On the other hand, the solid-type VDD and ground plane with a thinner dielectric insulator makes wide band property of the power supply impedance by eliminating the power/ground resonances. However, even adopting an insulator thickness of 16 um, the S21 property was still around -50 dB or so. In the present work, the power bus structure with wideband and high isolation properties of around -80 dB or more has been explored by the combination of thin-film insulator and planar EBG structure.
Keywords :
mixed analogue-digital integrated circuits; photonic band gap; printed circuit design; thin film capacitors; EBG-type VDD plane; dielectric insulator; ground resonances; high-isolation properties; high-speed digital circuits; mixed-signal circuit; multilayer PCB; planar electromagnetic band-gap structure; power bus structure; power resonances; power supply impedance; printed circuit board; radiated emission; return current discontinuity; thin-film embedded capacitor; wideband properties; Capacitors; Dielectric thin films; Dielectrics and electrical insulation; Fluctuations; Metamaterials; Periodic structures; Printed circuits; Thin film circuits; Transistors; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
ISSN :
0569-5503
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2007.373948
Filename :
4250034
Link To Document :
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