• DocumentCode
    2879924
  • Title

    Solder Joint Characteristics and Reliability of Lead-Free Area Array Packages Assembled Under Various Tin-Lead Soldering Process Conditions

  • Author

    Nguyen, Jennifer ; Geiger, David ; Rooney, Daniel ; Shangguan, Dongkai

  • Author_Institution
    Flextronics Int., San Jose
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    1340
  • Lastpage
    1349
  • Abstract
    The compatibility of lead-free area array packages with tin-lead soldering processes is a critical issue, as several product categories may take advantage of the exemptions under the European Union (EU) RoHS legislation and continue to be built with tin-lead solder for some time to come, whereas the components have become predominantly lead-free. The issue of "backward compatibility" arises because for BGA packages, the contribution of solder balls to the resultant solder joint material is very high (typically of 70% to 80%), and the assembly of lead-free BGA packages with tin-lead paste becomes a major concern from the perspective of solder joint metallurgical uniformity and reliability. This paper presents a comprehensive study on the effects of critical process conditions on solder joint metallurgy and reliability of mixed alloy solder joints. The solder joint metallurgy of mixed alloys was characterized and the lead distribution through the solder joint was analyzed, for different package types and under various process conditions. The results showed that the solder paste amount (ultimately the tin percentage, Sn% in the alloy) and the reflow temperature play critical roles in the mixed alloy assembly, both in terms of compositional homogeneity and voiding. The reliability of mixed alloy solder joints was then studied at various process conditions, under different thermal and mechanical stress environments. The study revealed that the sensitivity of the reliability of the mixed alloy solder joints to the process condition depends on the type of environmental loading.
  • Keywords
    assembling; electronics packaging; lead alloys; reliability; soldering; solders; stress analysis; thermal analysis; tin alloys; Sn-Pb; backward compatibility; compositional homogeneity terms; environmental loading; lead-free area array package assembly reliability; mechanical stress environments; mixed alloy assembly; reflow temperature; solder joint characteristics; solder joint metallurgy; solder paste amount; thermal stress environments; tin-lead soldering process conditions; voiding terms; Assembly; Environmentally friendly manufacturing techniques; Inorganic materials; Joining materials; Lead; Legislation; Materials reliability; Packaging; Soldering; Tin alloys; Lead-free; SnAgCu alloy; backward compatibility; backward compatible assembly; bend test; drop test; mechanical shock environment; mixed alloy; reflow temperature; reliability; shear test; thermal cycle test; thermal shock environment; tin percentage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.373969
  • Filename
    4250055