Title :
A semi-blind channel estimation with superimposed pilot sequence for OFDM systems
Author :
Yang, Weiwei ; Cai, Yue-Ming
Author_Institution :
Lab. of Nation Mobile Commun. Res., Nanjing Inst. of Commun. Eng., China
Abstract :
This paper aims to apply the superimposed pilot sequence technique to semi-blind channel estimation for OFDM systems. We propose two kinds of joint semi-blind channel estimation and data detection structure which are based on the Viterbi algorithm and the maximum a posteriori (MAP) algorithm, respectively. Further, two kind iterative structures of joint semi-blind channel estimation, data detection and convolutional decoding, which based on soft out Viterbi algorithm (SOVA) and soft in soft out (SISO)-MAP algorithm respectively are proposed. We also present a reduced complexity scheme based on the principles of reduced-state sequence estimation. Numerical simulations demonstrate the performance of the proposed methods, comparing with the classical pilot-symbol-aided modulation (PSAM) estimation method [JK Moon et al, 2000] previously described and the subspace blind estimation method [Muquet, B et al., 2002].
Keywords :
OFDM modulation; Viterbi decoding; channel coding; channel estimation; convolutional codes; maximum likelihood decoding; maximum likelihood estimation; numerical analysis; OFDM systems; complexity scheme; convolutional decoding; data detection structure; joint semiblind channel estimation; maximum a posteriori algorithm; numerical simulations; pilot-symbol-aided modulation; reduced-state sequence estimation; soft in soft out algorithm; soft out Viterbi algorithm; subspace blind estimation method; superimposed pilot sequence; Bandwidth; Channel estimation; Frequency estimation; Iterative algorithms; Iterative decoding; Maximum likelihood decoding; Mobile communication; OFDM modulation; Partial transmit sequences; Viterbi algorithm;
Conference_Titel :
Communications and Information Technology, 2005. ISCIT 2005. IEEE International Symposium on
Print_ISBN :
0-7803-9538-7
DOI :
10.1109/ISCIT.2005.1567006