DocumentCode
2880282
Title
High speed A/D conversion
Author
van de Plassche, R.
Author_Institution
Philips Resesarch Laboratories, Eindhoven, Netherlands
Volume
XXVII
fYear
1984
fDate
22-24 Feb. 1984
Firstpage
130
Lastpage
131
Abstract
High-speed A/D converter designs show tradeoffs between conversion speed, system approach and available or projected technology: CMOS versus bipolar versus GaAs . . . Applications of converters in large signal processing systems require a further circuit evaluation to optimize die size, power dissipation, circuit performance and testability. This is especially true for Converters with resolutions above 6b . . . A better comparison of high speed converters may be possible if additional standardized test procedures at frequencies close to half of the sampling frequency are introduced . . . Some test procedures to be addressed are linearity and resolution measurement, signal-to-noise measurement, differential gain and phase measurement and a beat frequency test procedure. Applications of converters with resolution from 6 to 10b and sampling rates from 10 to 500MHz include digital processing systems, transient recording, digital oscilloscopes and video signal processing, such as color decoding, noise reduction systems and ghost cancellation procedures.
Keywords
CMOS technology; Circuit testing; Frequency conversion; Frequency measurement; Gain measurement; Gallium arsenide; Phase measurement; Signal processing; Signal resolution; Signal sampling;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1984 IEEE International
Conference_Location
San Francisco, CA, USA
Type
conf
DOI
10.1109/ISSCC.1984.1156687
Filename
1156687
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