DocumentCode :
2880314
Title :
Analysis of HBM-ESD current rise time and its deciding factors
Author :
Feng, Zhou ; Jiusheng, HUANG ; Yougang, Gao ; Sulin, LIU ; Xiqing, WANG ; Langfeng, WANG
Author_Institution :
Sch. of Telecommun. Eng., Beijing Univ. of Posts & Telecommun.
fYear :
2006
fDate :
1-4 Aug. 2006
Firstpage :
529
Lastpage :
533
Abstract :
Circuit model of ESD test circumstance is established. By inverse Laplace transform, analytical expression of current is got. Then we obtain simulation of current rise time (tr) under different combination of circuit parameters. A few fitted polynomials that describe the relationship of tr to these parameters are got, whose accuracy is also analyzed
Keywords :
Laplace transforms; electrostatic discharge; polynomials; testing; ESD test; HBM-ESD current rise time; fitted polynomials; human body model electrostatic discharge; inverse Laplace transform; Capacitance; Circuit simulation; Circuit testing; Electronic equipment testing; Electrostatic discharge; Immune system; Inductance; Laplace equations; Polynomials; Wire; Electrostatic discharge (ESD); circuit model; fitted polynomial; rise time; simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Environmental Electromagnetics, The 2006 4th Asia-Pacific Conference on
Conference_Location :
Dalian
Print_ISBN :
1-4244-0183-6
Type :
conf
DOI :
10.1109/CEEM.2006.258012
Filename :
4027344
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2880314
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