• DocumentCode
    2880314
  • Title

    Analysis of HBM-ESD current rise time and its deciding factors

  • Author

    Feng, Zhou ; Jiusheng, HUANG ; Yougang, Gao ; Sulin, LIU ; Xiqing, WANG ; Langfeng, WANG

  • Author_Institution
    Sch. of Telecommun. Eng., Beijing Univ. of Posts & Telecommun.
  • fYear
    2006
  • fDate
    1-4 Aug. 2006
  • Firstpage
    529
  • Lastpage
    533
  • Abstract
    Circuit model of ESD test circumstance is established. By inverse Laplace transform, analytical expression of current is got. Then we obtain simulation of current rise time (tr) under different combination of circuit parameters. A few fitted polynomials that describe the relationship of tr to these parameters are got, whose accuracy is also analyzed
  • Keywords
    Laplace transforms; electrostatic discharge; polynomials; testing; ESD test; HBM-ESD current rise time; fitted polynomials; human body model electrostatic discharge; inverse Laplace transform; Capacitance; Circuit simulation; Circuit testing; Electronic equipment testing; Electrostatic discharge; Immune system; Inductance; Laplace equations; Polynomials; Wire; Electrostatic discharge (ESD); circuit model; fitted polynomial; rise time; simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environmental Electromagnetics, The 2006 4th Asia-Pacific Conference on
  • Conference_Location
    Dalian
  • Print_ISBN
    1-4244-0183-6
  • Type

    conf

  • DOI
    10.1109/CEEM.2006.258012
  • Filename
    4027344
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2880314