Title :
Beatrice Winner Award for editorial excellence
Abstract :
Presents the recipient of the Beatrice Winner Award for editorial excellence.
Keywords :
Beatrice Winner award for editorial excellence; VLSI communication processor designed for testability; Awards;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1984 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1984.1156691