Title :
Copper-diamond pseudoalloys as breaking electrocontact material
Author :
lvanov, V.V. ; Kirko, V.I.
Author_Institution :
Research Physical-Technical Institute at the Krasnoyarsk State University
Keywords :
Atomic layer deposition; Contact resistance; Contactors; Copper alloys; Crystalline materials; Electric resistance; Materials testing; Silver; Temperature measurement; Welding;
Conference_Titel :
Application of the Conversion Research Results for International Cooperation, 1999. SIBCONVERS '99. The Third International Symposium
Conference_Location :
Tomsk, Russia
Print_ISBN :
0-7803-5172-X
DOI :
10.1109/SIBCON.1999.771726