Title :
Intrabeam scattering and touscheck lifetime for the optical stochastic cooling experiment at the MIT-Bates South Hall ring
Author :
Wang, F. ; Franklin, W. ; Van der Laan, J. ; Tschalär, C. ; Wang, D.
Author_Institution :
MIT, Middleton
Abstract :
A proof-of-principle experiment of optical stochastic cooling (OSC) at the MIT-Bates South Hall electron storage ring (SHR) has been proposed. To produce convincing cooling results, the ring will be run near 300 MeV. Beam emittance growth caused by Intrabeam scattering (IBS) is a major concern for the design of experiment. Touschek scattering imposes a dominant limit on beam lifetime. Evaluation of these effects is part of the design optimization process. Simulation analyses of cooling for a viable OSC experiment are presented.
Keywords :
particle beam dynamics; particle beam stability; storage rings; Touscheck lifetime; Touschek scattering; beam emittance growth; beam lifetime; electron storage ring; intrabeam scattering; optical stochastic cooling; Cooling; Design optimization; Electron optics; Optical design; Optical scattering; Particle scattering; Stimulated emission; Stochastic processes; Testing; Undulators;
Conference_Titel :
Particle Accelerator Conference, 2007. PAC. IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
978-1-4244-0916-7
DOI :
10.1109/PAC.2007.4440092
