DocumentCode
2880567
Title
Wafer Level Processing of Silicon Arrays for Implantable Medical Devices
Author
Bhandari, Rajmohan ; Negi, Sandeep ; Rieth, Loren ; Tõpper, Michael ; Normann, Richard A. ; Solzbacher, Florian
Author_Institution
Univ. of Utah, Salt Lake City
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
1567
Lastpage
1572
Abstract
Micro system technology is well suited to batch fabricate multiple electrodes neural probes, intended for recording and stimulating neural tissue. Silicon neural probes have been produced using fixed lithographic mask sets, which is straightforward but costly for small production volumes. We demonstrate a novel method to fabricate high throughput, three dimensional microneedle arrays with a mask-less process. The wafer level etching enables not only low cost process but also it reduces lead time. The concept is based on the use of wet isotropic silicon etchant to define pen/fork-shaped electrodes. A custom made stirring system has been developed, in which the wafer is placed in a recessed Teflon holder over an O-ring, which completely seal the back-side of the wafer from the wet etchant. The wafer scale etching process has been optimized and the etching results have been analyzed and compared with the array etching. The results indicate that the etching process is repeatable and electrode geometry is highly uniform. The electrode arrays´ mechanical strength was analyzed by poking the array into a known Young´s modulus polydimethylsiloxane (PDMS) sample.
Keywords
biomedical electrodes; elemental semiconductors; microelectrodes; micromechanical devices; prosthetics; silicon; fixed lithographic mask sets; implantable medical devices; mask-less process; microneedle arrays; microsystem technology; multiple electrodes neural probes; neural tissue; polydimethylsiloxane; silicon arrays; silicon neural probes; wafer level etching; wafer level processing; wet isotropic silicon etchant; Biomedical electrodes; Costs; Implantable biomedical devices; Lead time reduction; Probes; Production; Silicon; Structural rings; Throughput; Wet etching;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location
Reno, NV
ISSN
0569-5503
Print_ISBN
1-4244-0985-3
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2007.374004
Filename
4250090
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