Title :
3D modelling of enhanced surface emission using surface roughening
Author :
Buss, I.J. ; Cryan, M.J. ; Ho, D. ; Nash, G. ; Haigh, M.K. ; Craddock, I.J. ; Railton, C.J. ; Rarity, J.G.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. of Bristol, Bristol
Abstract :
3D FDTD is used to study the effect of surface roughening on the emission of a point source embedded in GaAs with a mirror behind the dipole. Enhancement factors of 10 : 1 are observed.
Keywords :
III-V semiconductors; finite difference time-domain analysis; gallium arsenide; light propagation; surface roughness; 3D FDTD; GaAs; enhanced surface emission 3D model; surface roughening; Etching; Finite difference methods; Light emitting diodes; Mirrors; Optical surface waves; Photonic crystals; Recycling; Rough surfaces; Surface roughness; Time domain analysis; (240.5770) Roughness; (250.3140) Integrated optoelectronic circuits;
Conference_Titel :
Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on
Conference_Location :
Long Beach, CA
Print_ISBN :
978-1-55752-813-1
Electronic_ISBN :
978-1-55752-813-1
DOI :
10.1109/CLEO.2006.4628802
