DocumentCode :
2880666
Title :
Evaluation of High Compliant Low Ag Solder Alloys on OSP as a Drop Solution for the 2nd Level Pb-Free Interconnection
Author :
Kim, Dongwook ; Suh, Daewoong ; Millard, Thomas ; Kim, Hyunchul ; Kumar, Chetan ; Zhu, Mark ; Xu, Youren
Author_Institution :
Intel Corp., Folsom
fYear :
2007
fDate :
May 29 2007-June 1 2007
Firstpage :
1614
Lastpage :
1619
Abstract :
Low Ag content alloys (Sn1.2Ag0.5Cu) with or without Ni doping on Cu organic solderability preservative (OSP) were evaluated as a high G drop solution to Sn4.0Ag0.5Cu with Ni/Au surface finish for the mobile electronics. Three key points are studied in this paper. First, the effect of increasing compliance of alloy was studied. High compliance and high plasticity energy dissipation effectively toughened the crack tip and prolonged the time to reach the critical stress for the fracture. Second, the effect of Ni doping to the interfacial phase formation was studied. The substitution of Ni for Cu effectively suppresses growth kinetics of intermetallic compounds (IMCs) and makes the IMC layer thin. Finally, reliability tests were conducted to evaluate thermomechanical and high G drop resistance of low Ag alloys with Cu OSP surface finish. Overall, low Ag content alloy systems enhance high G shock resistance significantly without sacrificing thermomechanical performance.
Keywords :
copper alloys; silver alloys; solders; tin alloys; Pb-free interconnection; SnAgCu; growth kinetics; interfacial phase formation; intermetallic compounds; low Ag content solder alloys; organic solderability preservative; plasticity energy dissipation; reliability tests; thermomechanical performance; Copper alloys; Doping; Energy dissipation; Gold alloys; Nickel alloys; Surface cracks; Surface finishing; Surface resistance; Thermal resistance; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
ISSN :
0569-5503
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2007.374010
Filename :
4250096
Link To Document :
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