DocumentCode
2881091
Title
Review of high voltage silicon carbide device research at the army research laboratory
Author
O´Brien, H. ; Ogunniyi, A. ; Scozzie, C.J. ; Shaheen, W. ; Agarwal, A. ; Zhang, Q. ; Temple, V.
Author_Institution
Army Res. Lab., Adelphi, MD, USA
fYear
2011
fDate
26-30 June 2011
Firstpage
1
Lastpage
1
Abstract
Summary form only given. The U.S. Army Research Laboratory has conducted research on high voltage silicon carbide thyristors and diodes in support of the Army´s pulsed power applications. Such applications require light-weight, power-dense components to enable mobile platforms. The Army Research Laboratory is seeking to optimize thyristor and diode capability at the single device level, then integrate chips into larger modules to meet high voltage and high current switching needs. Compared to silicon semiconductors, silicon carbide´s high breakdown field enables thinner high-voltage devices. The narrower drift region in turn facilitates faster turn-on capability and lower switching losses at very high voltages and current densities. The material´s thermal conductivity and high Young´s modulus make it ideal for high-power pulsed switching applications. Recent research developments that have increased die size, yield, and voltage blocking include production of larger material wafers, reduction in micropipe density, and reduction of basal plane dislocations. Progress in material growth and device design has led to development of 9 kV, 1.0 cm2 silicon carbide Super-GTOs and P-i-N diodes. The devices evolved over the past five years through cooperative agreements which leverage Silicon Power Corporation´s design and packaging techniques with Cree, Inc.´s material growth and fabrication capabilities. The program started with 3 kV, 0.16 cm2 Super-GTOs and 6 kV, 0.5 cm2 diodes in 2006. Each device iteration was evaluated under pulse stress conditions at the Army Research Laboratory. Important parameters recorded were DC voltage blocking, peak pulse current density, dl/dt, on-state voltage drop, recovery time, and stability. The performance of each design was compared back to earlier generations, as well as to similar silicon switches, in order to verify progress and determine the path forward. Most recently, the 1.0 cm2 Sup- r GTO was switched at a 120-μs wide pulse current as high as 5 kA (6.8 kA/cm2 over the active area), with a dl/dt of 400 A/μs. P-i-N diodes were packaged in pairs and switched in series with asymmetric GTOs to provide reverse voltage protection. Presently, GTOs are being packaged into 16-chip modules expected to switch >;60 kA. This paper will go into further detail of the design iterations, device and module performance, and future work.
Keywords
Young´s modulus; current density; p-i-n diodes; power semiconductor diodes; pulsed power switches; semiconductor device breakdown; silicon compounds; thermal conductivity; thyristors; wide band gap semiconductors; DC voltage blocking system; U.S. Army Research Laboratory; basal plane dislocation analysis; drift region; high Young modulus; high current density; high current switching analysis; high voltage silicon carbide diode; high voltage silicon carbide thyristors; high voltage switching analysis; high voltages density; high-power pulsed switching; light-weight power-dense component; material fabrication process; material growth process; material thermal conductivity; micropipe density; on-state voltage stability; p-i-n diode; peak pulse current density; pulse current analysis; silicon carbide high breakdown field; silicon carbide super-GTO diode; silicon power corporation design technique; silicon power corporation packaging technique; switching loss analysis; time 120 mus; voltage 3 kV; voltage 6 kV; voltage 9 kV; Laboratories; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science (ICOPS), 2011 Abstracts IEEE International Conference on
Conference_Location
Chicago, IL
ISSN
0730-9244
Print_ISBN
978-1-61284-330-8
Electronic_ISBN
0730-9244
Type
conf
DOI
10.1109/PLASMA.2011.5993032
Filename
5993032
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