DocumentCode
2881118
Title
2008 Symposium Outstanding Paper Award
fYear
2010
fDate
3-8 Oct. 2010
Firstpage
1
Lastpage
1
Abstract
The 2008 Symposium Outstanding Paper Award was presented to Melanie Etherton, Victor Axelrod, James W. Miller, Haim Marom (Freescale Semiconductor, Inc.); Tom Meuse (Thermo Fisher Scientific) for their paper "HBM ESD Failures Caused by a Parasitic Pre-Discharge Current Spike"
Keywords
Awards;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
Conference_Location
Reno, NV
Print_ISBN
978-1-58537-182-2
Type
conf
Filename
5623774
Link To Document