Title :
critical issues in ensuring reproducible and reliable deposition of NEG coatings for particle accelerators
Author :
Bonucci, A. ; Conte, A. ; Manini, P. ; Raimondi, S.
Author_Institution :
SAES Getters SpA, Lainate
Abstract :
Non evaporable getter (NEG) coating technology, developed at CERN in the late 90s´, is an effective pumping solution for conductance limited vacuum chambers. It reduces thermal out-gassing and provides distributed pumping ability, allowing the achievement of very low pressure. NEG films do show additional interesting features, like low secondary electron yield and low gas de-sorption rates under ions, electrons and photons bombardment. For these reasons, large scale adoption of NEG coated chambers is now a reality and several leading edge machines will soon benefit from it. A critical issue for the successful application of this technology is the ability to deposit NEG coatings in a reproducible and reliable way all along a pipe. This is particularly important for narrow-gap or specially shaped chambers which pose severe challenges in term of film thickness distribution, chemical composition and sorption properties. A dedicated study was carried out to fully understand the deposition process as a function of the sputtering parameters and the chamber geometry. Results obtained do allow optimizing the coating process.
Keywords :
coating techniques; particle accelerators; pumps; sputter deposition; thin films; CERN; NEG coatings; chemical composition; deposition process; electron bombardment; film thickness distribution; gas desorption rates; ion bombardment; nonevaporable getter coating technology; particle accelerators; photon bombardment; secondary electron yield; sorption properties; sputtering; thermal out-gassing; vacuum chambers; Chemical technology; Coatings; Electrons; Geometry; Gettering; Large-scale systems; Linear particle accelerator; Pumps; Sputtering; Vacuum technology;
Conference_Titel :
Particle Accelerator Conference, 2007. PAC. IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
978-1-4244-0916-7
DOI :
10.1109/PAC.2007.4440161