• DocumentCode
    2882281
  • Title

    Effects of long-line reflection on the instantaneous tunability of gyrotron backward-wave oscillators

  • Author

    Chen, S.H. ; Huang, W.Y. ; Chiou, C.C.

  • Author_Institution
    Dept. of Phys., Nat. Central Univ., Jhongli, Taiwan
  • fYear
    2011
  • fDate
    26-30 June 2011
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. The gyrotron backward-wave oscillator (gyro-BWO) is a coherent microwave/ millimeter wave radiation source based on the electron cyclotron maser instability. The backward wave oscillation occurs in a non-resonant structure, therefore, the continuous and instantaneous frequency tuning can be achieved by varying the beam voltage or the magnetic field. However, the discontinuous tuning was observed in previous experiments due to the lone-line reflection induced by the external circuit. In this study, the effects of long-line reflections on the tunability of gyro-BWO were examined by using the stationary code and the Particle-In-Cell simulation code. The numerical results show that the dynamical behavior of the gyro-BWO is sensitive to the distance of the reflection point to the oscillator (Lext). As Lext is increased, the discontinuity in frequency tuning becomes more severe and the instantaneous tunability of the gyro-BWO is deteriorated due to the hysteresis phenomenon. The details will be presented in the paper.
  • Keywords
    backward wave oscillators; cyclotron masers; gyrotrons; backward wave oscillation; beam voltage; coherent microwave/millimeter wave radiation source; discontinuous tuning; dynamical behavior; electron cyclotron maser instability; frequency tuning; gyro-BWO; gyrotron backward-wave oscillators; hysteresis phenomenon; instantaneous tunability; long-line reflection; magnetic field; nonresonant structure; particle-in-cell simulation code; reflection point; stationary code; Gyrotrons; Oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science (ICOPS), 2011 Abstracts IEEE International Conference on
  • Conference_Location
    Chicago, IL
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-61284-330-8
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2011.5993112
  • Filename
    5993112