• DocumentCode
    2882554
  • Title

    The effect of core material surface roughness on line accuracy using electrodeposited photoresist

  • Author

    Jalonen, Paavo ; Tuominen, Aulis

  • Author_Institution
    Pori Sch. of Technol. & Econ., Tampere Univ. of Technol., Finland
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    156
  • Lastpage
    159
  • Abstract
    Miniaturization in electronics means finer lines and smaller vias in substrate technology. Very fine lines on the substrate are difficult to produce by conventional means. Thick copper layers are difficult to etch and the accuracy of conventional dry film photoresist is not necessarily sufficient. One very promising means of achieving fine lines is the etching of sputtered thin films on the substrate and growth of the copper with an additive method on the tiny lines. It has been shown that use of dry film photoresist is unsuitable for very narrow lines. Spinning the photoresist is an alternative, but in the test, its adhesion was not good enough. Most narrow resist lines were washed away in the development stage. To meet requirements for accuracy, the best method seemed to be the electrodeposited method, in which a very thin, even, homogenous photoresist layer can be generated. This fine layer is developed easily, thus allowing the transfer of fine line images to the substrate. For good accuracy on the metal lines, the core material beneath the sputtered metal layer must be smooth; the best accuracy can be achieved only with the smoothest surface. The differences between the original and only slightly brushed surfaces are not very obvious
  • Keywords
    copper; electrodeposition; etching; fine-pitch technology; packaging; photolithography; photoresists; printed circuit manufacture; surface topography; Cu; additive growth method; adhesion; copper; core material surface; core material surface roughness; development stage; dry film photoresist; electrodeposited method; electrodeposited photoresist; electronics; etching; fine line image transfer; fine lines; homogenous photoresist layer; line accuracy; metal lines; miniaturization; narrow resist lines; smooth surface; spin coating; sputtered metal layer; sputtered thin films; substrate technology; thick copper layers; vias; Additives; Copper; Dry etching; Resists; Rough surfaces; Spinning; Sputter etching; Sputtering; Substrates; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2000. (EMAP 2000). International Symposium on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    0-7803-6654-9
  • Type

    conf

  • DOI
    10.1109/EMAP.2000.904146
  • Filename
    904146