DocumentCode
288264
Title
The application of microscopy to dielectric mouldings
Author
Wolfe, S.V. ; Chan, H.K.C.
Author_Institution
STC Submarine Syst., London, UK
fYear
1994
fDate
34437
Firstpage
42491
Lastpage
42493
Abstract
As submarine cable systems are designed for high reliability, manufacturing processes and screening techniques have been developed to a very high standard to eliminate defects and inhomogeneities detrimental to short and long term performance. This has been achieved by an understanding of the factors giving rise to electrical weaknesses and thereby controlling moulding processes accordingly. This presentation describes the results of a programme of work aimed at understanding DC breakdown and ageing behaviour of DC insulation in order to achieve high reliability at minimised cost
Keywords
ageing; cable insulation; cable testing; electric breakdown; insulation testing; submarine cables; DC breakdown; DC insulation; ageing; defects; dielectric mouldings; electrical weaknesses; inhomogeneities; microscopy; reliability; submarine cable systems;
fLanguage
English
Publisher
iet
Conference_Titel
Characterisation of Dielectric Materials: a Review, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
369943
Link To Document