• DocumentCode
    2883237
  • Title

    A 250MHz 11Bit 20mW CMOS Low-Hold-Pedestal Fully Differential Track-and-Hold Circuit

  • Author

    Tsung-Sum Lee ; Chi-Chang Lu ; Jian-Ting Zhan

  • Author_Institution
    Dept. of Electron. Eng., Nat. Yunlin Univ. of Sci. & Technol., Touliu
  • fYear
    2006
  • fDate
    26-28 April 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A new technique for realizing a very-high-speed low-power low-voltage fully differential CMOS track-and-hold circuit with low hold pedestal is presented. To achieve high sampling linearity the circuit utilizes bootstrapped input switch. The fully differential design relaxes the trade-off between sampling speed and the sampling precision. The circuit design of major building blocks is described in detailed. A prototype circuit in a 0.35-mum CMOS process is integrated and experimental results are presented. The track-and-hold circuit operates up to 250MHz of sampling frequency with less than -69dB of total harmonic distortion corresponding to 11bits for an input 85MHz sinusoidal amplitude of 1.8 Vpp at a 3V supply. This total harmonic distortion measurement reflects the held values as well as the tracking components of the output waveform. In these conditions, a differential hold pedestal of less than 1mV, 0.8ns acquisition time at 1.8V step input, and 1.8 Vpp full-scale differential input range are achieved. The circuit dissipates 20mW with a 3V power supply
  • Keywords
    CMOS integrated circuits; bootstrap circuits; high-speed integrated circuits; integrated circuit design; low-power electronics; sample and hold circuits; 0.35 micron; 0.8 ns; 1.8 V; 11 bit; 20 mW; 250 MHz; 3 V; 85 MHz; CMOS track-and-hold circuit; bootstrapped input switch; circuit design; harmonic distortion; low hold pedestal; CMOS process; Circuit synthesis; Distortion measurement; Frequency; Linearity; Prototypes; Sampling methods; Switches; Switching circuits; Total harmonic distortion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test, 2006 International Symposium on
  • Conference_Location
    Hsinchu
  • Print_ISBN
    1-4244-0179-8
  • Type

    conf

  • DOI
    10.1109/VDAT.2006.258137
  • Filename
    4027509