• DocumentCode
    2883424
  • Title

    Alpha particle effects on bipolar ECL static arrays

  • Author

    Voldman, Steven ; Patrick, L. ; Wong, D.

  • Author_Institution
    IBM General Technology Division, Essex Junction, VT, USA
  • Volume
    XXVIII
  • fYear
    1985
  • fDate
    13-15 Feb. 1985
  • Firstpage
    262
  • Lastpage
    263
  • Abstract
    This paper will discuss results obtained between experimental studies and circuit simulation of the soft error rates versus critical charge in static bipolar ECL memory arrays. Design optimization and process innovation was used to achieve failure rates below 0.1 fails/bit/Khr with critical charge exceeding 300fC.
  • Keywords
    Alpha particles; Emergency power supplies; Error analysis; Error correction; Isolation technology; Logic; Passivation; Radiation effects; Semiconductor materials; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1985 IEEE International
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1985.1156869
  • Filename
    1156869
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2883424