Computer-aided design for VLSI

Author

Kang, S.M.

Author_Institution

Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana-Champaign, IL, USA

fYear

1991

fDate

16-17 Jun 1991

Firstpage

1

Abstract

New CAD issues related to MOS VLSI and optoelectronic integration technologies are reviewed. Especially, new issues on performance and timing driven physical layout, design for VLSI manufacturability and reliability using time-efficient simulation technologies are discussed. In contrast, CAD issues in optoelectronics are presently at the device modeling and circuit simulation level. CAD environments that support fast turnaround model development and circuit verification are discussed with specific optical device models of semiconductor lasers, photodetectors and optical logic gates

Keywords

MOS integrated circuits; VLSI; circuit CAD; circuit layout CAD; integrated optoelectronics; CAD issues; MOS VLSI; OEIC; circuit simulation; design for manufacturability; device modeling; optical device models; optical logic gates; optoelectronic integration; photodetectors; physical layout; reliability; semiconductor lasers; time-efficient simulation; Circuit simulation; Computational modeling; Design automation; Integrated circuit reliability; Laser modes; Optical devices; Semiconductor device manufacture; Timing; Very large scale integration; Virtual manufacturing;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on

Conference_Location

Shenzhen

Type

conf

DOI

10.1109/CICCAS.1991.184233

Filename

184233