Title :
Support Losses in Micromechanical Resonators Under Electrostatic and Piezoelectric Actuations
Author :
Rong Zhu ; Guoping Zhang
Author_Institution :
Dept. of Precision Instrum. & Mechanology, Tsinghua Univ., Beijing, China
Abstract :
Elimination of support losses has been important in boosting quality factors of micromechanical resonators. A high-quality factor is one of the requirements for the realization of micromechanical resonators applied to modern communication systems, sensors, etc. In this paper, we present theoretical and experimental studies on the support losses in micromechanical resonators driven by electrostatic and piezoelectric actuations separately. We experimentally demonstrate that a piezoelectric actuation can take less support loss than its electrostatic counterpart using an AFM probe actuated by piezoelectric and electrostatic effects, respectively. The study also shows that the energy loss to the support in the piezoelectric resonators could be reduced by decreasing the clamped region area of the piezoelectric material layer on the substrate, and using the piezoelectric material with a smaller ratio of the piezoelectric coefficients along the thickness to the length.
Keywords :
Q-factor; atomic force microscopy; microlenses; micromechanical resonators; piezoelectric actuators; AFM probe; boosting quality factors; electrostatic actuations; micromechanical resonators; piezoelectric actuations; support losses; Electrostatic actuators; Electrostatics; Probes; Q factor; Stress; Substrates; Vibrations; Micromechanical resonator; piezoelectric actuation; quality factor; support loss;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2012.2211008