DocumentCode
2884312
Title
Application of the DVM method for transference of resistance values
Author
Zorzano, R. ; de Aguilar, J. Diaz
Author_Institution
Electr. Stand. Lab., INTA, Spain
fYear
1999
fDate
1999
Firstpage
42401
Lastpage
42404
Abstract
Great difficulties arise with the application of the resistance standard based on the Hall effect (QHR). Any Hall-effect-based device has to be previously characterised in order to assess its correct performance. This characterisation must be done by a National Institute, provided with the adequate measurement systems and degree of expertise. Such measurement systems are excessively complex and expensive for the industry. To overcome this problem, M.E. Cage et al. (1991) investigated the use of high precision multimeters for measurement of the quantum Hall effect. In this paper the application of this system at the DC and LF Standards Laboratory of INTA is presented as a transfer method for the 10 kΩ reference standard to other laboratories
Keywords
quantum Hall effect; 10 kohm; DVM method; QHE resistance standard; calibration; high precision multimeters; repeatability; transfer standard; transference of resistance values; uncertainties;
fLanguage
English
Publisher
iet
Conference_Titel
Measurement Dissemination by Transfer Methods (Ref. No. 1999/048), IEE Seminar
Conference_Location
London
Type
conf
DOI
10.1049/ic:19990247
Filename
771964
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