• DocumentCode
    2884312
  • Title

    Application of the DVM method for transference of resistance values

  • Author

    Zorzano, R. ; de Aguilar, J. Diaz

  • Author_Institution
    Electr. Stand. Lab., INTA, Spain
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    42401
  • Lastpage
    42404
  • Abstract
    Great difficulties arise with the application of the resistance standard based on the Hall effect (QHR). Any Hall-effect-based device has to be previously characterised in order to assess its correct performance. This characterisation must be done by a National Institute, provided with the adequate measurement systems and degree of expertise. Such measurement systems are excessively complex and expensive for the industry. To overcome this problem, M.E. Cage et al. (1991) investigated the use of high precision multimeters for measurement of the quantum Hall effect. In this paper the application of this system at the DC and LF Standards Laboratory of INTA is presented as a transfer method for the 10 kΩ reference standard to other laboratories
  • Keywords
    quantum Hall effect; 10 kohm; DVM method; QHE resistance standard; calibration; high precision multimeters; repeatability; transfer standard; transference of resistance values; uncertainties;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Measurement Dissemination by Transfer Methods (Ref. No. 1999/048), IEE Seminar
  • Conference_Location
    London
  • Type

    conf

  • DOI
    10.1049/ic:19990247
  • Filename
    771964