• DocumentCode
    288445
  • Title

    Applications of binary neural networks learning to pattern classification

  • Author

    Chu, C.H. ; Kim, J.H. ; Kim, I.

  • Author_Institution
    Center for Adv. Comput. Studies, Southwestern Louisiana Univ., Lafayette, LA, USA
  • Volume
    2
  • fYear
    1994
  • fDate
    27 Jun-2 Jul 1994
  • Firstpage
    907
  • Abstract
    This paper considers the use of binary neural networks for pattern classification. An expand-and-truncate learning (ETL) algorithm is used to determine the required number of neurons as well as the connecting weights in a three-layered feedforward network for classifying input patterns. The ETL algorithm is guaranteed to find a network for any binary-to-binary mappings. The ETL algorithm´s performance in pattern classification is tested using a breast cancer database that have been used for benchmarking performance other machine learning methods. The ETL algorithm decomposes an arbitrarily linearly nonseparable function into multiple linearly separable functions, each of which is realized by a neuron in the hidden layer. ETL first finds the required hyperplanes for the given patterns, based on a geometrical analysis of the given patterns. The weights and thresholds are determined based on these identified hyperplanes. Depending on the given training patterns, the required number of neurons in the hidden layer will be determined by ETL
  • Keywords
    feedforward neural nets; learning (artificial intelligence); pattern classification; binary neural networks learning; binary-to-binary mappings; breast cancer database; expand-and-truncate learning algorithm; hyperplanes; linearly nonseparable function; pattern classification; three-layered feedforward network; Benchmark testing; Breast cancer; Databases; Joining processes; Learning systems; Machine learning algorithms; Neural networks; Neurons; Pattern analysis; Pattern classification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-1901-X
  • Type

    conf

  • DOI
    10.1109/ICNN.1994.374301
  • Filename
    374301