• DocumentCode
    2884793
  • Title

    SCN Z-domain equivalent circuit fault diagnosis

  • Author

    Chieh, Chuang ; Zheng-guo, Wu

  • Author_Institution
    Dept. of Equipment Repairing, PLA, Guang Zhou, China
  • fYear
    1991
  • fDate
    16-17 Jun 1991
  • Firstpage
    256
  • Abstract
    The authors have devised a new fault diagnosis method for SCNs (switched-capacitor networks)-Z-domain equivalent circuit fault diagnosis, and presents its principle, mathematical background and algorithm realization. Then the diagnosability of SCNs by the new method is discussed, and the topological testability theory of the analog circuit fault diagnosis problem is extended to the SCN. The necessary condition of the k-node fault testability for SCN is given. This is extremely powerful because the result depends only on the topology of the Z-domain equivalent network and the condition can be checked by inspection. Finally, an applied example is given to illustrate the technique
  • Keywords
    equivalent circuits; fault location; network analysis; network topology; switched capacitor networks; Z-domain; fault diagnosis; k-node fault testability; topological testability theory; Admittance; Artificial intelligence; Charge measurement; Circuit faults; Current measurement; Equations; Equivalent circuits; Fault diagnosis; Q measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on
  • Conference_Location
    Shenzhen
  • Type

    conf

  • DOI
    10.1109/CICCAS.1991.184333
  • Filename
    184333