• DocumentCode
    2885067
  • Title

    Some results of particle in cell simulations of initial argon Dielectric Barrier Discharges

  • Author

    Huerta, M.A. ; Ludeking, L.

  • Author_Institution
    Phys. Dept., Univ. of Miami, Coral Gables, FL, USA
  • fYear
    2011
  • fDate
    26-30 June 2011
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. We simulate Dielectric Barrier Discharges (DBD) in Argon using the commercial particle in cell (PIC) code MAGIC. The simulations are done in pure Argon at atmospheric pressure to avoid the complications that occur in air. We study DBDs with an embedded surface electrode and also with an exposed surface electrode. The only particle creation -destruction effect we consider is the ionization of Argon by electron impact. The ion drag is based on the process of charge exchange of an ion with its parent gas. The electron drag cross section is based on BEB (binary encounter Bethe) cross section with a low energy correction. Our simulations last only about one nanosecond due to the large number of electrons produced, which fill our computer memory. We calculate the momentum imparted to the neutral gas during each time step by collisions with the ions and electrons and also the total accumulated momentum density imparted to the neutral gas during the entire simulation. This effect has been called the electrohydrodynamic (EHD) force. The discharge is so fast that the neutral atoms have no time to move and are considered to be at rest.
  • Keywords
    argon; discharges (electric); ionisation; plasma collision processes; plasma density; plasma dielectric properties; plasma simulation; plasma transport processes; Ar; argon dielectric barrier discharge; charge exchange; electrohydrodynamic force; electron drag; electron impact; ion drag; ionization; neutral gas; particle-in-cell simulations; plasma simulation; surface electrode; Dielectrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science (ICOPS), 2011 Abstracts IEEE International Conference on
  • Conference_Location
    Chicago, IL
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-61284-330-8
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2011.5993325
  • Filename
    5993325