DocumentCode :
2885141
Title :
Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers
Author :
Schulz-Ruhtenbery, M. ; Ackemann, T. ; Huang, K.F. ; Babushkin, I. ; Loiko, N.
Author_Institution :
Inst. fur Angewandte Phys., Munster Univ., Germany
fYear :
2005
fDate :
12-17 June 2005
Firstpage :
150
Abstract :
This work studies the patterns emitted by broad-area VCSELs with a square aperture of 40 μ by 40 μ. The devices are oxide-confined top-emitters lasing at around 780 nm. By controlling the device temperature the above mentioned detuning can be changed and thus the length scales of the patterns. For decreasing temperatures the divergence angle of the emission (the transverse wave number) increases and fewer modes are selected resulting in a less complex pattern. This paper studies these relationships quantitatively and considers how to extract the value of the detuning experimentally. In the theory, phase lag in the spacer layer as well as the one in the Bragg reflector is taken into account. Additionally, this study looks into the polarization properties of the emission.
Keywords :
laser beams; laser cavity resonators; laser mirrors; laser modes; light polarisation; semiconductor lasers; stimulated emission; surface emitting lasers; 40 mum; 780 nm; Bragg reflector; broad-area VCSEL; detuning; device temperature; emission divergence angle; emission pattern; length scales; optical modes; oxide-confined top-emitters; phase lag; polarization properties; spacer layer; transverse patterns; transverse wave number; vertical-cavity surface-emitting lasers; Apertures; Frequency; Laser beams; Laser modes; Laser theory; Physics; Polarization; Resonance; Surface emitting lasers; Vertical cavity surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics Conference, 2005. EQEC '05. European
Print_ISBN :
0-7803-8973-5
Type :
conf
DOI :
10.1109/EQEC.2005.1567321
Filename :
1567321
Link To Document :
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