• DocumentCode
    2885245
  • Title

    A 35ns 128K fusible bipolar PROM

  • Author

    Phi Thai ; Chang, Silvia ; Mann Yang

  • Author_Institution
    Advanced Micro Devices, Sunnyvale, CA, USA
  • Volume
    XXIX
  • fYear
    1986
  • fDate
    19-21 Feb. 1986
  • Firstpage
    44
  • Lastpage
    45
  • Abstract
    A bipolar PROM using 2μm slot-isolation technology will be reported. Circuits include a column-current multiplexer and temperature-compensated sensing. The die size is 306×224 mil2.
  • Keywords
    Circuit testing; Fuses; Logic programming; Manufacturing processes; Materials reliability; PROM; Platinum; Process control; Silicides; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1986 IEEE International
  • Conference_Location
    Anaheim, CA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1986.1156972
  • Filename
    1156972
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2885245