DocumentCode :
2885245
Title :
A 35ns 128K fusible bipolar PROM
Author :
Phi Thai ; Chang, Silvia ; Mann Yang
Author_Institution :
Advanced Micro Devices, Sunnyvale, CA, USA
Volume :
XXIX
fYear :
1986
fDate :
19-21 Feb. 1986
Firstpage :
44
Lastpage :
45
Abstract :
A bipolar PROM using 2μm slot-isolation technology will be reported. Circuits include a column-current multiplexer and temperature-compensated sensing. The die size is 306×224 mil2.
Keywords :
Circuit testing; Fuses; Logic programming; Manufacturing processes; Materials reliability; PROM; Platinum; Process control; Silicides; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1986 IEEE International
Conference_Location :
Anaheim, CA, USA
Type :
conf
DOI :
10.1109/ISSCC.1986.1156972
Filename :
1156972
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2885245
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