DocumentCode
2885310
Title
Ultrafast soft X-ray absorption spectroscopy
Author
Seres, E. ; Spielmann, Ch
Author_Institution
Phys. Inst. EPI, Wurzburg Univ., Germany
fYear
2005
fDate
12-17 June 2005
Firstpage
160
Abstract
This paper demonstrates time resolved X-ray absorption spectroscopy with a resolution in the sub-20 fs range around the L-edge (100 eV) of amorphous silicon (XANES) and gathered information beyond the L-edge about the atomic structure with EXAFS. This setup can be easily adapted for other materials such as carbon, and open the way to gain insight into fast dynamical processes of large organic molecules.
Keywords
EXAFS; X-ray optics; amorphous semiconductors; atomic structure; elemental semiconductors; high-speed optical techniques; silicon; 100 eV; 20 fs; EXAFS; Si; XANES; amorphous silicon; atomic structure; carbon; fast dynamical processes; large organic molecules; soft X-ray absorption spectroscopy; time resolved spectroscopy; ultrafast spectroscopy; Amorphous silicon; Electromagnetic wave absorption; Laser beam cutting; Monitoring; Optical harmonic generation; Optical pulse generation; Spectroscopy; Ultrafast optics; X-ray lasers; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics Conference, 2005. EQEC '05. European
Print_ISBN
0-7803-8973-5
Type
conf
DOI
10.1109/EQEC.2005.1567331
Filename
1567331
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